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Hecate: A Modular Genomic Compressor
发表于 2026 来源 arxiv
作者
Kamila Szewczyk,Sven Rahmann
摘要
We present Hecate, a modular lossless genomic compression framework. It is designed around uncommon but practical source-coding choices. Unlike many s 更多..
Clustering Approach for Higher-Order Deterministic Masking
发表于 2026 来源 cryptology
作者
Vahid Jahandideh,Jan Schoone,Lejla Batina
摘要
Masking typically relies on fresh online randomness to prevent higher-order side-channel leakage, which is costly to generate on constrained devices. 更多..
Security Risks of VOA-Induced Luminescence in Chip-Based quantum key distribution
发表于 2026 来源 arxiv
作者
Zijian Li,Chenyu Xu,Xin Hua,Yongqiang Du,Xin Liu,Tao Lin,Xi Xiao,Kejin Wei
摘要
Integrated photonics is widely regarded as a key enabler for scalable quantum key distribution (QKD), offering compactness, stability, and compatibili 更多..
DALC-CT: Dynamic Analysis of Low-Level Code Traces for Constant-Time Verification
发表于 2026 来源 arxiv
作者
Nges Brian Njungle,Edwin P Kayang,Mishel J Paul,Michel A Kinsy
摘要
Timing side-channel attacks exploit variations in program execution time to recover sensitive information. Cryptographic implementations are especiall 更多..
Fault Location of Generator Stator with Single-Phase High-Resistance Grounding Fault Based on Signal Injection.
发表于 2025-10-03 来源 Sensors (Basel, Switzerland) DOI 10.3390/S25196132
作者
Binghui Lei Yifei Wang Zongzhen Yang Lijiang Ma Xinzhi Yang Yanxun Guo Shuai Xu Zhiping Cheng
单位
Baihetan Hydropower Plant, Liangshan 615400, China.;School of Electrical and Information Engineering, Zhengzhou University, Zhengzhou 450001, China.;China Three展开 Baihetan Hydropower Plant, Liangshan 615400, China.;School of Electrical and Information Engineering, Zhengzhou University, Zhengzhou 450001, China.;China Three Gorges International Corporation, Beijing 100006, China.
摘要
This paper proposes a novel method for locating single-phase grounding faults in generator stator windings with high resistance, which are typically c 更多..
Research on Fault Probability Based on Hamming Weight in Fault Injection Attack
发表于 2025-09-23 来源 Computers, Materials & Continua DOI 10.32604/CMC.2025.066525
作者
Tong Wu Dawei Zhou
单位
Department of Information Security, Naval University of Engineering, Wuhan, 430000, China
摘要
Fault attacks have emerged as an increasingly effective approach for integrated circuit security attacks due to their short execution time and minimal 更多..
Research on Line Selection Method Based on Active Injection Under DC Feeder Single-Pole Grounding Fault
发表于 2025-09-18 来源 Energies DOI 10.3390/EN18184958
作者
Xinghua Huang Yuanliang Fan Wenqi Li Jiayang Fei Jianhua Wang
单位
State Grid Fujian Electric Power Research Institute, Fuzhou 350007, China;Fujian Key Enterprise Laboratory of High Reliability for Power Distribution Technology展开 State Grid Fujian Electric Power Research Institute, Fuzhou 350007, China;Fujian Key Enterprise Laboratory of High Reliability for Power Distribution Technology, Fuzhou 350003, China;School of Electrical Engineering, Southeast University, Nanjing 210096, China
摘要
Due to the “low damping” characteristics of the DC distribution system, the traditional passive scheme is not suitable for DC fault detection and posi 更多..
Multidimensional Fault Injection and Simulation Analysis for Random Number Generators
发表于 2025-09-18 来源 Electronics DOI 10.3390/ELECTRONICS14183702
作者
Xianli Xie Jiansheng Chen Jiajun Zhou Ruiqing Zhai Xianzhao Xia
单位
State Key Laboratory of Intelligent Vehicle Safety Technology, Chongqing 401133, China;School of Microelectronics, Tianjin University, Tianjin 300192, China;CAT展开 State Key Laboratory of Intelligent Vehicle Safety Technology, Chongqing 401133, China;School of Microelectronics, Tianjin University, Tianjin 300192, China;CATARC Technology Co., Ltd., Tianjin 300399, China
摘要
Random number generators play a critical role in ensuring information security, supporting encrypted communications, and preventing data leakage. Howe 更多..
NC-ROLL-FIA: Negative capacitance FET based designs for robust logic locking against fault injection attacks enabling trustworthy hardware for edge AI devices
发表于 2025-09-01 来源 Results in Engineering DOI 10.1016/J.RINENG.2025.106962
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作者
Kadiyam Tirumalarao Ramesh Vaddi M. Durga Prakash Asisa Kumar Panigrahy J. Ajayan Amit Krishna Dwivedi
单位
Department of Electronics and Communication Engineering, School of Engineering and Sciences, SRM University-AP, Mangalagiri, Andhra Pradesh 522240, India;Depart展开 Department of Electronics and Communication Engineering, School of Engineering and Sciences, SRM University-AP, Mangalagiri, Andhra Pradesh 522240, India;Department of ECE, Faculty of Science and Technology (IcfaiTech), ICFAI Foundation for Higher Education Hyderabad, Hyderabad 501203, India;Department of ECE, SR University, Telangana, India;School of Engineering, University of Warwick, Coventry CV4 7AL United Kingdom
摘要
Development of trustworthy and secure hardware for Edge AI devices with increasing Deep Learning applications has gained recent attention. Logic locki 更多..
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