论文列表
4 ·关键词:fault-injection
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Multidimensional Fault Injection and Simulation Analysis for Random Number Generators
发表于 2025-09-18 来源 Electronics DOI 10.3390/ELECTRONICS14183702
作者
Xianli Xie Jiansheng Chen Jiajun Zhou Ruiqing Zhai Xianzhao Xia
单位
State Key Laboratory of Intelligent Vehicle Safety Technology, Chongqing 401133, China;School of Microelectronics, Tianjin University, Tianjin 300192, China;CAT展开 State Key Laboratory of Intelligent Vehicle Safety Technology, Chongqing 401133, China;School of Microelectronics, Tianjin University, Tianjin 300192, China;CATARC Technology Co., Ltd., Tianjin 300399, China
摘要
Random number generators play a critical role in ensuring information security, supporting encrypted communications, and preventing data leakage. Howe 更多..
Virtualized Fault Injection Framework for ISO 26262-Compliant Digital Component Hardware Faults
发表于 2024-07-16 来源 Electronics DOI 10.3390/ELECTRONICS13142787
作者
Rui Almeida Vitor Silva Jorge Cabral
单位
Department of Industrial Electronics, Centro Algoritmi, University of Minho, 4800-058 Guimarães, Portugal
摘要
Simulation-based Fault Injection (FI) is crucial for validating system behaviour in safety-critical applications, such as the automotive industry. The 更多..
Representative Real-Time Dataset Generation Based on Automated Fault Injection and HIL Simulation for ML-Assisted Validation of Automotive Software Systems
发表于 2024-01-20 来源 Electronics DOI 10.3390/ELECTRONICS13020437
作者
Mohammad Abboush Christoph Knieke Andreas Rausch
单位
Institute for Software and Systems Engineering, Technische Universität Clausthal, 38678 Clausthal-Zellerfeld, Germany
摘要
Recently, a data-driven approach has been widely used at various stages of the system development lifecycle thanks to its ability to extract knowledge 更多..
A Methodology for Accelerating FPGA Fault Injection Campaign Using ICAP
发表于 2023-02-06 来源 Electronics DOI 10.3390/ELECTRONICS12040807
作者
Ferlini Frederico Viel Felipe Seman Laio Oriel Pettenghi Hector Bezerra Eduardo Augusto Leithardt Valderi Reis Quietinho
单位
System & Verification Group, Cadence Design Systems GmbH, 85622 Feldkirchen, Germany;Department of Electrical Engineering, Federal University of Santa Catarina展开 System & Verification Group, Cadence Design Systems GmbH, 85622 Feldkirchen, Germany;Department of Electrical Engineering, Federal University of Santa Catarina (UFSC), Florianópolis 88040-900, Brazil;Graduate Program in Applied Computer Science, University of Vale do Itajaí (UNIVALI), Itajaí 88302-901, Brazil;COPELABS—Lusófona University of Humanities and Technologies, Campo Grande 376, 1749-024 Lisboa, Portugal;VALORIZA, Research Center for Endogenous Resources Valorization, Instituto Politécnico de Portalegre, 7300-555 Portalegre, Portugal
摘要
The increasing complexity of System-on-Chip (SoC) and the ongoing technology miniaturization on Integrated Circuit (IC) manufacturing processes makes 更多..