论文头条 | DplsLab_北京智慧云测设备技术有限公司

Fault Location of Generator Stator with Single-Phase High-Resistance Grounding Fault Based on Signal Injection.

发表于 2025-10-03 来源 Sensors (Basel, Switzerland) DOI 10.3390/S25196132

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作者

Binghui Lei Yifei Wang Zongzhen Yang Lijiang Ma Xinzhi Yang Yanxun Guo Shuai Xu Zhiping Cheng

单位

Baihetan Hydropower Plant, Liangshan 615400, China.;School of Electrical and Information Engineering, Zhengzhou University, Zhengzhou 450001, China.;China Three展开

Baihetan Hydropower Plant, Liangshan 615400, China.;School of Electrical and Information Engineering, Zhengzhou University, Zhengzhou 450001, China.;China Three Gorges International Corporation, Beijing 100006, China.

摘要

This paper proposes a novel method for locating single-phase grounding faults in generator stator windings with high resistance, which are typically c 更多..

Research on Fault Probability Based on Hamming Weight in Fault Injection Attack

发表于 2025-09-23 来源 Computers, Materials & Continua DOI 10.32604/CMC.2025.066525

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作者

Tong Wu Dawei Zhou

单位

Department of Information Security, Naval University of Engineering, Wuhan, 430000, China

摘要

Fault attacks have emerged as an increasingly effective approach for integrated circuit security attacks due to their short execution time and minimal 更多..

AES data dependence Fault attacks Hamming weight mutual information analysis side-channel attacks

Research on Line Selection Method Based on Active Injection Under DC Feeder Single-Pole Grounding Fault

发表于 2025-09-18 来源 Energies DOI 10.3390/EN18184958

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作者

Xinghua Huang Yuanliang Fan Wenqi Li Jiayang Fei Jianhua Wang

单位

State Grid Fujian Electric Power Research Institute, Fuzhou 350007, China;Fujian Key Enterprise Laboratory of High Reliability for Power Distribution Technology展开

State Grid Fujian Electric Power Research Institute, Fuzhou 350007, China;Fujian Key Enterprise Laboratory of High Reliability for Power Distribution Technology, Fuzhou 350003, China;School of Electrical Engineering, Southeast University, Nanjing 210096, China

摘要

Due to the “low damping” characteristics of the DC distribution system, the traditional passive scheme is not suitable for DC fault detection and posi 更多..

fault line selection grounding fault harmonic injection protection design

Multidimensional Fault Injection and Simulation Analysis for Random Number Generators

发表于 2025-09-18 来源 Electronics DOI 10.3390/ELECTRONICS14183702

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作者

Xianli Xie Jiansheng Chen Jiajun Zhou Ruiqing Zhai Xianzhao Xia

单位

State Key Laboratory of Intelligent Vehicle Safety Technology, Chongqing 401133, China;School of Microelectronics, Tianjin University, Tianjin 300192, China;CAT展开

State Key Laboratory of Intelligent Vehicle Safety Technology, Chongqing 401133, China;School of Microelectronics, Tianjin University, Tianjin 300192, China;CATARC Technology Co., Ltd., Tianjin 300399, China

摘要

Random number generators play a critical role in ensuring information security, supporting encrypted communications, and preventing data leakage. Howe 更多..

CTR-DRBG Fault injection FPGA random number generator

针对KASLR绕过的脆弱性指令挖掘

发表于 2025-09-15 来源电子与信息学报

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作者

李周阳邱朋飞卿昱王春露汪东升

单位

北京邮电大学网络空间安全学院;北京邮电大学可信分布式计算与服务教育部重点实验室;中关村实验室;清华大学计算机科学与技术系;

内核地址空间随机化微架构侧信道攻击硬件安全脆弱性指令

NC-ROLL-FIA: Negative capacitance FET based designs for robust logic locking against fault injection attacks enabling trustworthy hardware for edge AI devices

发表于 2025-09-01 来源 Results in Engineering DOI 10.1016/J.RINENG.2025.106962

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作者

Kadiyam Tirumalarao Ramesh Vaddi M. Durga Prakash Asisa Kumar Panigrahy J. Ajayan Amit Krishna Dwivedi

单位

Department of Electronics and Communication Engineering, School of Engineering and Sciences, SRM University-AP, Mangalagiri, Andhra Pradesh 522240, India;Depart展开

Department of Electronics and Communication Engineering, School of Engineering and Sciences, SRM University-AP, Mangalagiri, Andhra Pradesh 522240, India;Department of ECE, Faculty of Science and Technology (IcfaiTech), ICFAI Foundation for Higher Education Hyderabad, Hyderabad 501203, India;Department of ECE, SR University, Telangana, India;School of Engineering, University of Warwick, Coventry CV4 7AL United Kingdom

摘要

Development of trustworthy and secure hardware for Edge AI devices with increasing Deep Learning applications has gained recent attention. Logic locki 更多..

Fault injection attack (FIA) Hardware obfuscation Hardware Security Logic locking Negative capacitance FETs (NCFETs) Trustworthy edge AI devices

Reliability of LEON3 Processor’s Program Counter Against SEU, MBU, and SET Fault Injection

发表于 2025-08-27 来源 Cryptography DOI 10.3390/CRYPTOGRAPHY9030054

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作者

Afef Kchaou Sehmi Saad Hatem Garrab Mohsen Machhout

单位

IUT Bordeaux, GEII Departement, Bordeaux University, 15 Street of Naudet, 33170 Bordeaux, France;Electronics and Micro-Electronic Laboratory (LEµE), Bd de L’env展开

IUT Bordeaux, GEII Departement, Bordeaux University, 15 Street of Naudet, 33170 Bordeaux, France;Electronics and Micro-Electronic Laboratory (LEµE), Bd de L’environnement, Monastir 5000, Tunisia;RF2S Spectrum Solutions, 18 Street of the Faïencerie, 33300 Bordeaux, France

摘要

This paper presents a comprehensive register transfer-level (RTL) fault injection study targeting the program counter (PC) of the LEON3 processor, a S 更多..

LEON3 multiple-bit upset NETlist fault injection processor dependability program counter single-event transient single-event upset

嵌入式AI硬件单元的侧信道分析方法概述

发表于 2025-08-15 来源密码学报(中英文) DOI 10.13868/j.cnki.jcr.000791

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作者

金诚斌高宜文高锐尤博李丹

单位

工业和信息化部电子第五研究所智能制造装备通用质量技术及应用工业和信息化部重点实验室;南京理工大学网络空间安全学院;

侧信道分析对抗样本机器学习模型提取逆向分析

抗量子密码SIM芯片研究

发表于 2025-07-25 来源信息通信技术与政策

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作者

姜琨李增局刘梅娟代俊锋刘勇肖青

单位

芯昇科技有限公司;

SIM 侧信道分析安全防御抗量子密码

基于循环展开结构的抗侧信道攻击SM4 IP核设计

发表于 2025-06-15 来源密码学报(中英文) DOI 10.13868/j.cnki.jcr.000786

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作者

张倩高宜文刘月君赵竟霖张锐

单位

中国科学院信息工程研究所;中国科学院大学网络空间安全学院;网络空间安全防御全国重点实验室;南京理工大学网络空间安全学院;

SM4 单位面积吞吐率密钥搜索空间循环展开结构抗侧信道攻击