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NC-ROLL-FIA: Negative capacitance FET based designs for robust logic locking against fault injection attacks enabling trustworthy hardware for edge AI devices

发表于 2025-09-01 来源 Results in Engineering DOI 10.1016/J.RINENG.2025.106962

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作者

Kadiyam Tirumalarao Ramesh Vaddi M. Durga Prakash Asisa Kumar Panigrahy J. Ajayan Amit Krishna Dwivedi

单位

Department of Electronics and Communication Engineering, School of Engineering and Sciences, SRM University-AP, Mangalagiri, Andhra Pradesh 522240, India;Depart展开

Department of Electronics and Communication Engineering, School of Engineering and Sciences, SRM University-AP, Mangalagiri, Andhra Pradesh 522240, India;Department of ECE, Faculty of Science and Technology (IcfaiTech), ICFAI Foundation for Higher Education Hyderabad, Hyderabad 501203, India;Department of ECE, SR University, Telangana, India;School of Engineering, University of Warwick, Coventry CV4 7AL United Kingdom

摘要

Development of trustworthy and secure hardware for Edge AI devices with increasing Deep Learning applications has gained recent attention. Logic locki 更多..

Fault injection attack (FIA) Hardware obfuscation Hardware Security Logic locking Negative capacitance FETs (NCFETs) Trustworthy edge AI devices

Countermeasures Against Fault Injection Attacks in Processors: A Review

发表于 2025-04-05 来源 Information DOI 10.3390/INFO16040293

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作者

Roua Boulifa Giorgio Di Natale Paolo Maistri

单位

Univ. Grenoble Alpes, CNRS, Grenoble INP1, TIMA, 38000 Grenoble, France

摘要

Physical attacks pose a significant threat to the security of embedded processors, which have become an integral part of our daily lives. Processors c 更多..

countermeasures fault injection attacks Hardware Security RISC-V security

A Novel Clustering Technique Using Backscattering Side Channel for Counterfeit IC Detection

发表于 2020-01-01 来源 CYBER SENSING 2020 DOI 10.1117/12.2561172

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作者

Nguyen Luong N. Yilmaz Baki Berkay Cheng Chia Lin Prvulovic Milos Zajic Alenka

单位

Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA; Georgia Inst Technol, Coll Comp, Atlanta, GA 30332 USA

摘要

Over the past few years, globalization of the semiconductor supply chain has led companies to outsource much of the production cycle for integrated ci 更多..

Backscattering Cloned IC Clustering Counterfeit IC Hardware Security Reliability