A Novel Clustering Technique Using Backscattering Side Channel for Counterfeit IC Detection
作者
单位
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA; Georgia Inst Technol, Coll Comp, Atlanta, GA 30332 USA
摘要
Over the past few years, globalization of the semiconductor supply chain has led companies to outsource much of the production cycle for integrated ci 更多..
