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NC-ROLL-FIA: Negative capacitance FET based designs for robust logic locking against fault injection attacks enabling trustworthy hardware for edge AI devices

发表于 2025-09-01 来源 Results in Engineering DOI 10.1016/J.RINENG.2025.106962

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作者

Kadiyam Tirumalarao Ramesh Vaddi M. Durga Prakash Asisa Kumar Panigrahy J. Ajayan Amit Krishna Dwivedi

单位

Department of Electronics and Communication Engineering, School of Engineering and Sciences, SRM University-AP, Mangalagiri, Andhra Pradesh 522240, India;Depart展开

Department of Electronics and Communication Engineering, School of Engineering and Sciences, SRM University-AP, Mangalagiri, Andhra Pradesh 522240, India;Department of ECE, Faculty of Science and Technology (IcfaiTech), ICFAI Foundation for Higher Education Hyderabad, Hyderabad 501203, India;Department of ECE, SR University, Telangana, India;School of Engineering, University of Warwick, Coventry CV4 7AL United Kingdom

摘要

Development of trustworthy and secure hardware for Edge AI devices with increasing Deep Learning applications has gained recent attention. Logic locki 更多..

Fault injection attack (FIA) Hardware obfuscation Hardware Security Logic locking Negative capacitance FETs (NCFETs) Trustworthy edge AI devices