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Reliability of LEON3 Processor’s Program Counter Against SEU, MBU, and SET Fault Injection
发表于 2025-08-27 来源 Cryptography DOI 10.3390/CRYPTOGRAPHY9030054
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作者
Afef Kchaou Sehmi Saad Hatem Garrab Mohsen Machhout
单位
IUT Bordeaux, GEII Departement, Bordeaux University, 15 Street of Naudet, 33170 Bordeaux, France;Electronics and Micro-Electronic Laboratory (LEµE), Bd de L’env展开 IUT Bordeaux, GEII Departement, Bordeaux University, 15 Street of Naudet, 33170 Bordeaux, France;Electronics and Micro-Electronic Laboratory (LEµE), Bd de L’environnement, Monastir 5000, Tunisia;RF2S Spectrum Solutions, 18 Street of the Faïencerie, 33300 Bordeaux, France
摘要
This paper presents a comprehensive register transfer-level (RTL) fault injection study targeting the program counter (PC) of the LEON3 processor, a S 更多..
LEON3 multiple-bit upset NETlist fault injection processor dependability program counter single-event transient single-event upset
嵌入式AI硬件单元的侧信道分析方法概述
发表于 2025-08-15 来源 密码学报(中英文) DOI 10.13868/j.cnki.jcr.000791
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作者
金诚斌 高宜文 高锐 尤博 李丹
单位
工业和信息化部电子第五研究所智能制造装备通用质量技术及应用工业和信息化部重点实验室;南京理工大学网络空间安全学院;
侧信道分析 对抗样本 机器学习 模型提取 逆向分析
基于循环展开结构的抗侧信道攻击SM4 IP核设计
发表于 2025-06-15 来源 密码学报(中英文) DOI 10.13868/j.cnki.jcr.000786
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作者
张倩 高宜文 刘月君 赵竟霖 张锐
单位
中国科学院信息工程研究所;中国科学院大学网络空间安全学院;网络空间安全防御全国重点实验室;南京理工大学网络空间安全学院;
SM4 单位面积吞吐率 密钥搜索空间 循环展开结构 抗侧信道攻击
Analysis of the SEU Tolerance of an FPGA-Based Time-to-Digital Converter Using Emulation-Based Fault Injection
发表于 2025-05-27 来源 Electronics DOI 10.3390/ELECTRONICS14112176
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作者
Roza Teklehaimanot Siecha Getachew Alemu Jeffrey Prinzie Paul Leroux
单位
Department of Electrical and Computer Engineering, Addis Ababa Science and Technology University, Addis Ababa P.O. Box 16417, Ethiopia;Department of Electrical展开 Department of Electrical and Computer Engineering, Addis Ababa Science and Technology University, Addis Ababa P.O. Box 16417, Ethiopia;Department of Electrical and Computer Engineering, Addis Ababa Institute of Technology, Addis Ababa University, Addis Ababa P.O. Box 1178, Ethiopia;Department of Electrical Engineering, Faculty of Engineering Technology, Katholieke Universiteit Leuven, 3000 Leuven, Belgium
摘要
In application domains where severe environmental conditions are unavoidable, including high-energy physics and nuclear power plants, accurate and dep 更多..
fault emulation field-programmable gate arrays (FPGAs) internal configuration access port (ICAP) radiation effects single-event upsets (SEUs) time-to-digital converters (TDCs)
Design methodology of digital sensors for detecting laser fault injection attacks in FPGAs
发表于 2025-05-19 来源 Journal of Cryptographic Engineering DOI 10.1007/S13389-025-00378-4
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作者
Shungo Hayashi Junichi Sakamoto Tsutomu Matsumoto
单位
Cyber Physical Security Research Institute,National Institute of Advanced Industrial Science and Technology, 2-3-26, Aomi,135-0064,Koto-ku,Tokyo,Japan;Environme展开 Cyber Physical Security Research Institute,National Institute of Advanced Industrial Science and Technology, 2-3-26, Aomi,135-0064,Koto-ku,Tokyo,Japan;Environment and Information Science,Yokohama National University,Tokiwadai 79-7,240-8501,Hodogayaku,Yokohama,Kanagawa,Japan
摘要
Laser fault injection (LFI) refers to a serious attack that modifies programs and data in embedded systems by introducing specific errors into a devic 更多..
Digital sensor Fault injection attack Field-programmable gate array Laser fault injection Ring oscillator Time-to-digital converter
AI-Driven Fault Injection Testing: Enhancing System Resilience with Automated Chaos Engineering
发表于 2025-05-08 来源 Asian Journal of Research in Computer Science DOI 10.9734/AJRCOS/2025/V18I6675
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作者
Chhaya Gunawat Rohit Gupta Jay Sunil Nankani
单位
Amazon, California, United States.;Geico, Indiana, United States.;Redfin, California, United States.
摘要
This paper presents a novel approach to enhancing system resilience through AI-driven fault injection testing, leveraging automated chaos engineering. 更多..
AI-driven testing chaos engineering Fault injection reinforcement learning system resilience
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