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Reliability of LEON3 Processor’s Program Counter Against SEU, MBU, and SET Fault Injection

发表于 2025-08-27 来源 Cryptography DOI 10.3390/CRYPTOGRAPHY9030054

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作者

Afef Kchaou Sehmi Saad Hatem Garrab Mohsen Machhout

单位

IUT Bordeaux, GEII Departement, Bordeaux University, 15 Street of Naudet, 33170 Bordeaux, France;Electronics and Micro-Electronic Laboratory (LEµE), Bd de L’env展开

IUT Bordeaux, GEII Departement, Bordeaux University, 15 Street of Naudet, 33170 Bordeaux, France;Electronics and Micro-Electronic Laboratory (LEµE), Bd de L’environnement, Monastir 5000, Tunisia;RF2S Spectrum Solutions, 18 Street of the Faïencerie, 33300 Bordeaux, France

摘要

This paper presents a comprehensive register transfer-level (RTL) fault injection study targeting the program counter (PC) of the LEON3 processor, a S 更多..

LEON3 multiple-bit upset NETlist fault injection processor dependability program counter single-event transient single-event upset

Relay Protection Device Reliability Assessment Through Radiation, Fault Injection and Fault Tree Analysis

发表于 2025-01-08 来源 Micromachines DOI 10.3390/MI16010069

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作者

Hualiang Zhou Hao Yu Zhiyang Zou Zhantao Su Zheng Xu Weitao Yang Chaohui He

单位

State Grid Electric Power Research Institute, NARI Group Corporation, Nanjing 211106, China;NARI Technology Co., Ltd., Nanjing 211106, China;School of Nuclear S展开

State Grid Electric Power Research Institute, NARI Group Corporation, Nanjing 211106, China;NARI Technology Co., Ltd., Nanjing 211106, China;School of Nuclear Science and Technology, Xi’an Jiaotong University, Xi’an 710071, China

摘要

Relay protection devices must operate continuously throughout the year without anomalies. With the integration of advanced technology and process chip 更多..

Fault injection fault tree analysis relay protection device single-event upset α-particle