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Analysis of the SEU Tolerance of an FPGA-Based Time-to-Digital Converter Using Emulation-Based Fault Injection

发表于 2025-05-27 来源 Electronics DOI 10.3390/ELECTRONICS14112176

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作者

Roza Teklehaimanot Siecha Getachew Alemu Jeffrey Prinzie Paul Leroux

单位

Department of Electrical and Computer Engineering, Addis Ababa Science and Technology University, Addis Ababa P.O. Box 16417, Ethiopia;Department of Electrical展开

Department of Electrical and Computer Engineering, Addis Ababa Science and Technology University, Addis Ababa P.O. Box 16417, Ethiopia;Department of Electrical and Computer Engineering, Addis Ababa Institute of Technology, Addis Ababa University, Addis Ababa P.O. Box 1178, Ethiopia;Department of Electrical Engineering, Faculty of Engineering Technology, Katholieke Universiteit Leuven, 3000 Leuven, Belgium

摘要

In application domains where severe environmental conditions are unavoidable, including high-energy physics and nuclear power plants, accurate and dep 更多..