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Reliability of LEON3 Processor’s Program Counter Against SEU, MBU, and SET Fault Injection

发表于 2025-08-27 来源 Cryptography DOI 10.3390/CRYPTOGRAPHY9030054

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作者

Afef Kchaou Sehmi Saad Hatem Garrab Mohsen Machhout

单位

IUT Bordeaux, GEII Departement, Bordeaux University, 15 Street of Naudet, 33170 Bordeaux, France;Electronics and Micro-Electronic Laboratory (LEµE), Bd de L’env展开

IUT Bordeaux, GEII Departement, Bordeaux University, 15 Street of Naudet, 33170 Bordeaux, France;Electronics and Micro-Electronic Laboratory (LEµE), Bd de L’environnement, Monastir 5000, Tunisia;RF2S Spectrum Solutions, 18 Street of the Faïencerie, 33300 Bordeaux, France

摘要

This paper presents a comprehensive register transfer-level (RTL) fault injection study targeting the program counter (PC) of the LEON3 processor, a S 更多..

LEON3 multiple-bit upset NETlist fault injection processor dependability program counter single-event transient single-event upset