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Enhancing neural network robustness: Laser fault injection resistance in 55-nm SRAM for space applications

发表于 2025-03-01 来源 Chinese Physics B DOI 10.1088/1674-1056/ADACD1

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作者

Qing Liu 清刘 Haomiao Cheng 浩淼程 Xiang Yao 骧姚 Zhengxuan Zhang 正选张 Zhiyuan Hu 志远胡 Dawei Bi 大炜毕

单位

State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Shanghai 200050, China;University of th展开

State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Shanghai 200050, China;University of the Chinese Academy of Sciences, Beijing 100049, China

摘要

The integration of artificial intelligence (AI) with satellite technology is ushering in a new era of space exploration, with small satellites playing 更多..