Fault injection and failure analysis on Xilinx 16 nm FinFET Ultrascale+ MPSoC
作者
单位
School of Nuclear Science & Technology, Xi'an Jiaotong University, Xi'an, China;Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy
摘要
Energetic particle strikes the device and induces data corruption in the configuration memory (CRAM), causing errors and even malfunctions in a system 更多..
