论文头条 | DplsLab_北京智慧云测设备技术有限公司

Fault injection and failure analysis on Xilinx 16 nm FinFET Ultrascale+ MPSoC

发表于 2022-06-01 来源 Nuclear Engineering and Technology DOI 10.1016/J.NET.2021.12.022

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作者

Yang Weitao Li Yonghong He Chaohui

单位

School of Nuclear Science & Technology, Xi'an Jiaotong University, Xi'an, China;Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy

摘要

Energetic particle strikes the device and induces data corruption in the configuration memory (CRAM), causing errors and even malfunctions in a system 更多..

Vulnerability evaluation on 16 nm FinFET Ultrascale+ MPSoC using fault injection and proton irradiation

发表于 2022-05-10 来源 Microelectronics Reliability DOI 10.1016/J.MICROREL.2022.114534

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作者

Li Yonghong Yang Weitao Wang Maocheng Li Yang Guo Yaxin Li Pei Zhao Haoyu He Chaohui Wang Di Yang Ye Zhang Xiaodong An Heng

单位

School of nuclear science and technology, Xi'an Jiaotong Univercity, Xi'an, China;Northwest Insitute of Nuclear Technology, Xi'an, China;National Key Laboratory展开

School of nuclear science and technology, Xi'an Jiaotong Univercity, Xi'an, China;Northwest Insitute of Nuclear Technology, Xi'an, China;National Key Laboratory of Materials Behavior and Evaluation Technology in Space Environment, Harbin Institute of Technology, Harbin, China;Science and Technology on Vacuum Technology and Physics Laboratory, Lanzhou Institute of Physics, Lanzhou, China

摘要

The SEE vulnerability in two ways bitstream loading implementations on a dynamic partial reconfiguration (DPR) design is examined using fault injectio 更多..

Dynamic partial reconfiguration Fault injection Proton irradiation Ultrascale+ MPSoC Vulnerability