作者
Li Yonghong
Yang Weitao
Wang Maocheng
Li Yang
Guo Yaxin
Li Pei
Zhao Haoyu
He Chaohui
Wang Di
Yang Ye
Zhang Xiaodong
An Heng
单位
School of nuclear science and technology, Xi'an Jiaotong Univercity, Xi'an, China;Northwest Insitute of Nuclear Technology, Xi'an, China;National Key Laboratory展开
School of nuclear science and technology, Xi'an Jiaotong Univercity, Xi'an, China;Northwest Insitute of Nuclear Technology, Xi'an, China;National Key Laboratory of Materials Behavior and Evaluation Technology in Space Environment, Harbin Institute of Technology, Harbin, China;Science and Technology on Vacuum Technology and Physics Laboratory, Lanzhou Institute of Physics, Lanzhou, China
摘要
The SEE vulnerability in two ways bitstream loading implementations on a dynamic partial reconfiguration (DPR) design is examined using fault injectio 更多..