论文列表
1 ·关键词:proton-irradiation
重置
Vulnerability evaluation on 16 nm FinFET Ultrascale+ MPSoC using fault injection and proton irradiation
发表于 2022-05-10 来源 Microelectronics Reliability DOI 10.1016/J.MICROREL.2022.114534
作者
Li Yonghong Yang Weitao Wang Maocheng Li Yang Guo Yaxin Li Pei Zhao Haoyu He Chaohui Wang Di Yang Ye Zhang Xiaodong An Heng
单位
School of nuclear science and technology, Xi'an Jiaotong Univercity, Xi'an, China;Northwest Insitute of Nuclear Technology, Xi'an, China;National Key Laboratory展开 School of nuclear science and technology, Xi'an Jiaotong Univercity, Xi'an, China;Northwest Insitute of Nuclear Technology, Xi'an, China;National Key Laboratory of Materials Behavior and Evaluation Technology in Space Environment, Harbin Institute of Technology, Harbin, China;Science and Technology on Vacuum Technology and Physics Laboratory, Lanzhou Institute of Physics, Lanzhou, China
摘要
The SEE vulnerability in two ways bitstream loading implementations on a dynamic partial reconfiguration (DPR) design is examined using fault injectio 更多..