论文列表
22 ·关键词:fault-injection
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Saca-FI: A microarchitecture-level fault injection framework for reliability analysis of systolic array based CNN accelerator
发表于 2023-06-08 来源 Future Generation Computer Systems DOI 10.1016/J.FUTURE.2023.05.009
作者
Tan Jingweijia Wang Qixiang Yan Kaige Wei Xiaohui Fu Xin
单位
College of Computer Science and Technology, Jilin University, Changchun, China;College of Communication Engineering, Jilin University, Changchun, China;Electric展开 College of Computer Science and Technology, Jilin University, Changchun, China;College of Communication Engineering, Jilin University, Changchun, China;Electrical and Computer Engineering Department, University of Houston, Houston, TX, USA
摘要
As convolutional neural network CNN accelerators are being adopted in emerging safety-critical areas, their reliability becomes prominent. The systoli 更多..
Failure Identification Using Model-Implemented Fault Injection with Domain Knowledge-Guided Reinforcement Learning
发表于 2023-02-14 来源 Sensors DOI 10.3390/S23042166
作者
Moradi Mehrdad Van Acker Bert Denil Joachim
单位
ICT-Department of Applied Engineering Faculty, University of Antwerp, Prinsstraat 13, 2000 Antwerp, Belgium;Flanders Make, Gaston Geenslaan 8, 3001 Heverlee, Be展开 ICT-Department of Applied Engineering Faculty, University of Antwerp, Prinsstraat 13, 2000 Antwerp, Belgium;Flanders Make, Gaston Geenslaan 8, 3001 Heverlee, Belgium
摘要
The safety assessment of cyber-physical systems (CPSs) requires tremendous effort, as the complexity of cyber-physical systems is increasing. A well-k 更多..
A Methodology for Accelerating FPGA Fault Injection Campaign Using ICAP
发表于 2023-02-06 来源 Electronics DOI 10.3390/ELECTRONICS12040807
作者
Ferlini Frederico Viel Felipe Seman Laio Oriel Pettenghi Hector Bezerra Eduardo Augusto Leithardt Valderi Reis Quietinho
单位
System & Verification Group, Cadence Design Systems GmbH, 85622 Feldkirchen, Germany;Department of Electrical Engineering, Federal University of Santa Catarina展开 System & Verification Group, Cadence Design Systems GmbH, 85622 Feldkirchen, Germany;Department of Electrical Engineering, Federal University of Santa Catarina (UFSC), Florianópolis 88040-900, Brazil;Graduate Program in Applied Computer Science, University of Vale do Itajaí (UNIVALI), Itajaí 88302-901, Brazil;COPELABS—Lusófona University of Humanities and Technologies, Campo Grande 376, 1749-024 Lisboa, Portugal;VALORIZA, Research Center for Endogenous Resources Valorization, Instituto Politécnico de Portalegre, 7300-555 Portalegre, Portugal
摘要
The increasing complexity of System-on-Chip (SoC) and the ongoing technology miniaturization on Integrated Circuit (IC) manufacturing processes makes 更多..
Fault Injection in Actuator Models for Testing of Automated Driving Functions
发表于 2023-01-12 来源 Vehicles DOI 10.3390/VEHICLES5010006
作者
Holzmann Hendrik Landersheim Volker Piram Udo Bartolozzi Riccardo Stoll Georg Atzrodt Heiko
单位
Fraunhofer Institute for Structural Durability and System Reliability LBF, 64289 Darmstadt, Germany;ZF Friedrichshafen AG, 88046 Friedrichshafen, Germany
摘要
In this work, a simulation framework for virtual testing of autonomous driving functions under the influence of a fault occurring in a component is pr 更多..
Fault injection and failure analysis on Xilinx 16 nm FinFET Ultrascale+ MPSoC
发表于 2022-06-01 来源 Nuclear Engineering and Technology DOI 10.1016/J.NET.2021.12.022
作者
Yang Weitao Li Yonghong He Chaohui
单位
School of Nuclear Science & Technology, Xi'an Jiaotong University, Xi'an, China;Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy
摘要
Energetic particle strikes the device and induces data corruption in the configuration memory (CRAM), causing errors and even malfunctions in a system 更多..
Vulnerability evaluation on 16 nm FinFET Ultrascale+ MPSoC using fault injection and proton irradiation
发表于 2022-05-10 来源 Microelectronics Reliability DOI 10.1016/J.MICROREL.2022.114534
作者
Li Yonghong Yang Weitao Wang Maocheng Li Yang Guo Yaxin Li Pei Zhao Haoyu He Chaohui Wang Di Yang Ye Zhang Xiaodong An Heng
单位
School of nuclear science and technology, Xi'an Jiaotong Univercity, Xi'an, China;Northwest Insitute of Nuclear Technology, Xi'an, China;National Key Laboratory展开 School of nuclear science and technology, Xi'an Jiaotong Univercity, Xi'an, China;Northwest Insitute of Nuclear Technology, Xi'an, China;National Key Laboratory of Materials Behavior and Evaluation Technology in Space Environment, Harbin Institute of Technology, Harbin, China;Science and Technology on Vacuum Technology and Physics Laboratory, Lanzhou Institute of Physics, Lanzhou, China
摘要
The SEE vulnerability in two ways bitstream loading implementations on a dynamic partial reconfiguration (DPR) design is examined using fault injectio 更多..
A novel emulation method to assess the effects of cosmic radiation for avionics SoC using the GA based fault injection hardware
发表于 2022-03-24 来源 Sādhanā DOI 10.1007/S12046-022-01823-4
作者
Pitchaimani Balasubramanian Sridharan Moorthi
单位
IITM Research Park,Chennai,India;National Institute of Technology,Trichy,India
摘要
In this paper a novel desktop cosmic radiation emulator to assess the effectiveness of mitigation towards single event upsets (SEUs) during the design 更多..
Fault Injection Attacks in Spiking Neural Networks and Countermeasures
发表于 2022-01-11 来源 Frontiers in Nanotechnology DOI 10.3389/FNANO.2021.801999
作者
Nagarajan Karthikeyan Li Junde Ensan Sina Sayyah Kannan Sachhidh Ghosh Swaroop
单位
School of Electrical Engineering and Computer Science, Penn State University, University Park, PA, United States ; Ampere Computing, Portland, OR, United States
摘要
Spiking Neural Networks (SNN) are fast emerging as an alternative option to Deep Neural Networks (DNN). They are computationally more powerful and pro 更多..
Practical, Low-Cost Fault Injection Attacks on Personal Smart Devices
发表于 2022-01-02 来源 Applied Sciences DOI 10.3390/APP12010417
作者
Delarea Shaked Oren Yossi
单位
Department of Software and Information Systems Engineering, Faculty of Engineering Sciences, Ben Gurion University of the Negev, Beer-Sheva 8410501, Israel
摘要
Fault attacks are traditionally considered under a threat model that assumes the device under test is in the possession of the attacker. We propose a 更多..
Fault Injection Attacks Utilizing Waveform Pattern Matching against Neural Networks Processing on Microcontroller
发表于 2022-01-01 来源 IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences DOI 10.1587/TRANSFUN.2021CIP0015
作者
FUKUDA Yuta YOSHIDA Kota FUJINO Takeshi
单位
Graduate School of Science and Technology, Ritsumeikan University;Department of Science and Engineering, Ritsumeikan University
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